Swift heavy ion induced interface modification in Ni/Ge

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 212, Issue 1-4, 2003, Pages 206-210

  Som, T ^a   Satpati, B ^a   Satyam, P V ^a   Kabiraj, D ^b   Ayyub, P ^c   Ghosh, S ^d   Gupta, Ajay ^e   Dev, B N ^a   Avasthi, D K ^b  

^a INSTITUTE OF PHYSICS   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

^d Belonia College   (India)

^e Inter University Consortium   (India)

Author keywords

Alloy formation; Electron microscopy; Swift heavy ion irradiation

Indexed keywords

NICKEL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ION IRRADIATION;

HEAVY IONS;

EID: 0242332356     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(03)01734-8     Document Type: Conference Paper

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