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Volumn 87, Issue 6, 2000, Pages 2742-2746

Electronic excitation induced mass transport on 200 MeV 107Ag+14 ion irradiated Si surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000373065     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372249     Document Type: Article
Times cited : (55)

References (23)
  • 18
    • 85037474751 scopus 로고    scopus 로고
    • e's, fluences and thickness of the amorphized layer in Ref. 9
    • e's, fluences and thickness of the amorphized layer in Ref. 9.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.