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Volumn , Issue , 2003, Pages 584-591

High Quality ATPG for Delay Defects

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; MATHEMATICAL MODELS; VECTORS;

EID: 0142215986     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (19)
  • 2
    • 0022307908 scopus 로고
    • Model for delay faults based upon paths
    • G. L. Smith "Model for delay faults based upon paths," Int. Test Conf. 1985.
    • (1985) Int. Test Conf.
    • Smith, G.L.1
  • 5
    • 0030214852 scopus 로고    scopus 로고
    • Classification and identification of non-robust untestable path delay faults
    • K. T. Cheng, and H. C. Chen, "Classification and identification of non-robust untestable path delay faults", CAD of Integrated Circuits and Systems, 1996.
    • (1996) CAD of Integrated Circuits and Systems
    • Cheng, K.T.1    Chen, H.C.2
  • 6
    • 0003107675 scopus 로고
    • An efficient automatic generation system for path delay faults in combinational Circuits
    • A. K. Majhi, J. Jacob, L.M. Patnaik and V.D. Agrawal, "An efficient automatic generation system for path delay faults in combinational Circuits", VLSI Design Conference, 1995.
    • (1995) VLSI Design Conference
    • Majhi, A.K.1    Jacob, J.2    Patnaik, L.M.3    Agrawal, V.D.4
  • 7
    • 0026238696 scopus 로고
    • DYNAMITE: An efficient automatic test pattern generation system for path delay faults
    • K. Fuchs, F. Fink and M. Schulz, "DYNAMITE: An efficient automatic test pattern generation system for path delay faults ", CAD of Integrated Circuits and Systems, 1991.
    • (1991) CAD of Integrated Circuits and Systems
    • Fuchs, K.1    Fink, F.2    Schulz, M.3
  • 9
    • 0034771498 scopus 로고    scopus 로고
    • FSIMGEO: A Test Generation Method for Path Delay Fault Test Using Fault Simulation and Genetic Optimization
    • S. Yihe and W. Qifa, "FSIMGEO: A Test Generation Method for Path Delay Fault Test Using Fault Simulation and Genetic Optimization", ASIC/ SOC Conference, 2001.
    • (2001) ASIC/SOC Conference
    • Yihe, S.1    Qifa, W.2
  • 11
    • 0142143959 scopus 로고    scopus 로고
    • Finding a small set of longest testable paths that cover every gate
    • Proceedings. International, 2002
    • M. Sharma, J.H. Patel, "Finding a small set of longest testable paths that cover every gate", Test Conference, 2002. Proceedings. International, 2002.
    • (2002) Test Conference
    • Sharma, M.1    Patel, J.H.2
  • 12
    • 0036916519 scopus 로고    scopus 로고
    • On theoretical and practical considerations of path selection for delay fault testing
    • ICCAD 2002
    • J.J. Liou, L.C. Wang, K.T. Cheng, "On theoretical and practical considerations of path selection for delay fault testing", Computer Aided Design, 2002. ICCAD 2002.
    • (2002) Computer Aided Design
    • Liou, J.J.1    Wang, L.C.2    Cheng, K.T.3
  • 13
    • 0036049286 scopus 로고    scopus 로고
    • False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation
    • J.J. Liou, A. Krstic, L.C. Wang, K.T. Cheng "False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation", Design Automation Conference, 2002.
    • (2002) Design Automation Conference
    • Liou, J.J.1    Krstic, A.2    Wang, L.C.3    Cheng, K.T.4
  • 15
    • 0031381295 scopus 로고    scopus 로고
    • Fast Identification of Untestable Delay Faults using Implications
    • K. Heragu, J.H. Patel, V.D. Agrawal, "Fast Identification of Untestable Delay Faults using Implications", CAD 1997.
    • (1997) CAD 1997
    • Heragu, K.1    Patel, J.H.2    Agrawal, V.D.3
  • 18
    • 0026992434 scopus 로고
    • CRIS: A test cultivation program for sequential VLSI circuits
    • D.G. Saab, Y.G. Saab and J.A. Abraham, "CRIS: A test cultivation program for sequential VLSI circuits", CAD 1992.
    • (1992) CAD 1992
    • Saab, D.G.1    Saab, Y.G.2    Abraham, J.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.