Fast identification of untestable delay faults using implications

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 642-647

  Heragu, Keerthi ^a   Patel, Janak H ^a   Agrawal, Vishwani D ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; MATHEMATICAL MODELS;

AUTOMATIC TEST PATTERN GENERATION (ATPG) TOOL; PATH DELAY FAULT MODELS; PRECOMPUTED STATIC LOGIC IMPLICATIONS; UNTESTABLE DELAY FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0031381295     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.1997.643606     Document Type: Conference Paper

References (16)