Application of genetically engineered finite-statemachine sequences to sequential circuit ATPG

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 17, Issue 3, 1998, Pages 239-254

  Hsiao, Michael S ^a,b   Rudnick, Elizabeth M ^a,c   Patel, Janak H ^a,c  

^a Department of IEEE ^*  (United States)

^b RUTGERS UNIVERSITY   (United States)

^c University of Illinois at Urbana Champaign   (United States)

Author keywords

Automatic test generation; Genetic engineering; Pseudoregisters; State justification

Indexed keywords

FINITE AUTOMATA; FLIP FLOP CIRCUITS; GENETIC ALGORITHMS; SEQUENTIAL CIRCUITS; SEQUENTIAL MACHINES;

AUTOMATIC TEST PATTERN GENERATION (ATPG);

INTEGRATED CIRCUIT TESTING;

EID: 0032025470     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.700722     Document Type: Article

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