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Volumn 21, Issue 5, 2003, Pages
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Controlling the composition of Ti1-xAlxN thin films by modifying the number of TiN and ALN subcycles in atomic layer deposition
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM NITRIDE;
CHEMICAL VAPOR DEPOSITION;
COPPER;
TITANIUM NITRIDE;
ULSI CIRCUITS;
ATOMIC LAYER DEPOSITION;
THIN FILMS;
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EID: 0142027025
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1590963 Document Type: Conference Paper |
Times cited : (9)
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References (21)
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