Dielectric properties of Co-doped Ba0.5Sr0.5TiO 3 thin films fabricated by pulsed laser deposition

Journal of Crystal Growth

Volumn 259, Issue 1-2, 2003, Pages 137-143

  Wang, S Y ^a   Cheng, B L ^a   Wang, Can ^a   Lu, H B ^a   Zhou, Y L ^a   Chen, Z H ^a   Yang, G Z ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

A1. Crystal structure; A1. Doping; A1. X ray diffraction; A3. Laser epitaxy; B1. Perovskites; B2. Dielectric materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; COBALT; DOPING (ADDITIVES); PULSED LASER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

LASER EPITAXY;

THIN FILMS;

EID: 0141884986     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2003.07.023     Document Type: Article

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