The effect of annealing on the structure and dielectric properties of BaxSr1-xTiO3 ferroelectric thin films

Applied Physics Letters

Volumn 69, Issue 1, 1996, Pages 25-27

  Knauss, L A ^a,c   Pond, J M ^a   Horwitz, J S ^a   Chrisey, D B ^a   Mueller, C H ^b   Treece, Randolph ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b SCT   (United States)

^c NRL NRC Coop Research Associate

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001904072     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118106     Document Type: Article

References (8)

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