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Volumn 330, Issue 2, 1998, Pages 89-95

Structure and electrical properties of boron-added (Ba,Sr)TiO3 thin films fabricated by the sol-gel method

Author keywords

Boron; BST thin film; Schottky emission; Sintering additive; Sol gel

Indexed keywords

ADDITIVES; ATOMIC FORCE MICROSCOPY; BARIUM TITANATE; BORON; CRYSTAL MICROSTRUCTURE; CURRENT DENSITY; LEAKAGE CURRENTS; LIGHT EMISSION; PERMITTIVITY; SOL-GELS; STRONTIUM COMPOUNDS; THIN FILMS;

EID: 0032157628     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00560-4     Document Type: Article
Times cited : (40)

References (30)
  • 13
    • 0346094492 scopus 로고
    • translated by M. J. Lakin, Springer-Verlag, New York, Chapter 3
    • H. Scholze: Glass Nature, Structure and Properties, translated by M. J. Lakin, Springer-Verlag, New York, 1991, Chapter 3, p. 298.
    • (1991) Glass Nature, Structure and Properties , pp. 298
    • Scholze, H.1
  • 19
    • 0003495856 scopus 로고
    • International Center for Diffraction Data, Swarthmore, PA, Card No. 39-1395
    • Powder Diffraction File, International Center for Diffraction Data, Swarthmore, PA, 1989, Card No. 39-1395.
    • (1989) Powder Diffraction File
  • 30
    • 0012537372 scopus 로고
    • G. Barvotlin, A. Vapaille (Eds.), North-Holland, Amsterdam, Chapter 5
    • P. Hesto, in: G. Barvotlin, A. Vapaille (Eds.), Instabilities in Silicon Devices, Vol. 1, North-Holland, Amsterdam, 1986, Chapter 5, p. 263.
    • (1986) Instabilities in Silicon Devices , vol.1 , pp. 263
    • Hesto, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.