Combined electron-hole dynamics at UV-irradiated ultrathin Si-SiO2 interfaces probed by second harmonic generation

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 8, 2003, Pages

  Fomenko, Vasiliy ^a   Borguet, Eric ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE; SILICON DERIVATIVE; SILICON DIOXIDE;

ARTICLE; ELECTRIC FIELD; ELECTRON TRANSPORT; ENERGY; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; ULTRAVIOLET RADIATION;

EID: 0141758430     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.081301     Document Type: Article

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