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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 19, 2002, Pages 1931031-1931034

Characterization of charge-carrier dynamics in thin oxide layers on silicon by second harmonic generation

(10) Glinka, Yu D a Wang, W a Singh, S K a Marka, Z a Rashkeev, S N a Shirokaya, Y a Albridge, R a Pantelides, S T a Tolk, N H a Lucovsky, G b

a VANDERBILT UNIVERSITY (United States)

b NORTH CAROLINA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE; ZIRCONIUM OXIDE;

ARTICLE; DYNAMICS; MATERIALS; MATERIALS TESTING; PHYSICS;

EID: 0037092745 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (58)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.