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Volumn 13, Issue 5, 2003, Pages 686-692
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A measurement of Young's modulus and residual stress in MEMS bridges using a surface profiler
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFERENTIAL EQUATIONS;
ELASTIC MODULI;
MATHEMATICAL MODELS;
MECHANICAL VARIABLES MEASUREMENT;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
RESIDUAL STRESSES;
SILICON NITRIDE;
THIN FILMS;
ANALYTICAL BEAM THEORY;
FIXED FIXED BEAM;
MICROELECTROMECHANICAL BRIDGES;
SURFACE PROFILER;
MICROELECTROMECHANICAL DEVICES;
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EID: 0141718806
PISSN: 09601317
EISSN: None
Source Type: Journal
DOI: 10.1088/0960-1317/13/5/321 Document Type: Article |
Times cited : (55)
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References (9)
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