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Volumn 13, Issue 5, 2003, Pages 686-692

A measurement of Young's modulus and residual stress in MEMS bridges using a surface profiler

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; ELASTIC MODULI; MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RESIDUAL STRESSES; SILICON NITRIDE; THIN FILMS;

EID: 0141718806     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/13/5/321     Document Type: Article
Times cited : (55)

References (9)
  • 1
    • 0032138470 scopus 로고    scopus 로고
    • Surface micromachining for microelectromechanical systems
    • Bustillo J M, Howe R T and Muller R S 1998 Surface micromachining for microelectromechanical systems Proc. IEEE 86 1552-74
    • (1998) Proc. IEEE , vol.86 , pp. 1552-1574
    • Bustillo, J.M.1    Howe, R.T.2    Muller, R.S.3
  • 3
    • 0034427924 scopus 로고    scopus 로고
    • Young's modulus measurement of nickel silicide film on crystal silicon by a surface profiler
    • Qin M and Poon V M C 2000 Young's modulus measurement of nickel silicide film on crystal silicon by a surface profiler J. Mater. Sci. Lett. 19 2243-5
    • (2000) J. Mater. Sci. Lett. , vol.19 , pp. 2243-2245
    • Qin, M.1    Poon, V.M.C.2
  • 4
    • 0033719568 scopus 로고    scopus 로고
    • Microbridge testing of silicon nitride thin films deposited on silicon wafers
    • Zhang T-Y, Su Y-J, Qian C-F, Zhan M-H and Chen L-Q 2000 Microbridge testing of silicon nitride thin films deposited on silicon wafers Acta Mater. 48 2843-57
    • (2000) Acta Mater. , vol.48 , pp. 2843-2857
    • Zhang, T.-Y.1    Su, Y.-J.2    Qian, C.-F.3    Zhan, M.-H.4    Chen, L.-Q.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.