-
3
-
-
85199262990
-
New materials and processes - Improved applications
-
Sept.
-
Morris, J., 1998, "New Materials and Processes - Improved Applications," Advanced Packaging Magazine, Sept.
-
(1998)
Advanced Packaging Magazine
-
-
Morris, J.1
-
4
-
-
0030717772
-
Advanced encapsulation processing for low cost electronics assembly: A cost analysis
-
Pascarella, N. W., and Baldwin, D. F., 1998, "Advanced Encapsulation Processing for Low Cost Electronics Assembly: A Cost Analysis," Advances in Electronic Packaging EEP19-1, pp. 50-53.
-
(1998)
Advances in Electronic Packaging EEP19-1
, pp. 50-53
-
-
Pascarella, N.W.1
Baldwin, D.F.2
-
5
-
-
85199248439
-
Variable frequency microwave technology: A new approach to curing
-
September
-
Panchapakesan, B., Mead, P. F., and Fathi, Z., September 1997, "Variable Frequency Microwave Technology: A New Approach to Curing," Advanced Packaging Magazine
-
(1997)
Advanced Packaging Magazine
-
-
Panchapakesan, B.1
Mead, P.F.2
Fathi, Z.3
-
6
-
-
0033366575
-
Comparison of die level stresses in chip-on-board packages processed with convection and variable frequency microwave encapsulant curing
-
Denver, CO
-
Zou, Y., Johson, W., Suhling, J., Jaeger, R., Harris, J., Kromis, C., Ahmad, I. Tudker, D., and Fathi, Z., 1999, "Comparison of Die Level Stresses in Chip-On-Board Packages Processed with Convection and Variable Frequency Microwave Encapsulant Curing," Proc., SPIE-Society for Optical Engineering: Int. Conference on High Density Packaging and Multichip Modules, v. 3830, Denver, CO, pp. 7-16.
-
(1999)
Proc., SPIE-Society for Optical Engineering: Int. Conference on High Density Packaging and Multichip Modules
, vol.3830
, pp. 7-16
-
-
Zou, Y.1
Johson, W.2
Suhling, J.3
Jaeger, R.4
Harris, J.5
Kromis, C.6
Ahmad, I.7
Tudker, D.8
Fathi, Z.9
-
8
-
-
0141504087
-
Basic principles of microwave power heating
-
Hamid, M., 1992, "Basic Principles of Microwave Power Heating," Heat Transfer Eng., 13(4), pp. 73-84.
-
(1992)
Heat Transfer Eng.
, vol.13
, Issue.4
, pp. 73-84
-
-
Hamid, M.1
-
9
-
-
0003058129
-
2 to 18 GHz broadband microwave heating systems
-
Lauf, R., Bible, D., Johnson, A., Everleigh, C., 1993, "2 to 18 GHz Broadband Microwave Heating Systems," Microwave J., 36(11), pp. 24-34.
-
(1993)
Microwave J.
, vol.36
, Issue.11
, pp. 24-34
-
-
Lauf, R.1
Bible, D.2
Johnson, A.3
Everleigh, C.4
-
10
-
-
0141615628
-
Rapid processing and properties evaluation of flip-chip underfills
-
March
-
Anderson, B., Ahmad, I., Tucker, D, Goldstein, S., Fathi, Z., Ramamoorthy, A., and Mead, P., March 1998. "Rapid Processing and Properties Evaluation of Flip-Chip Underfills," Proc., Technical Program NEPCON West '98 Conference, Anaheim, CA, vol. 3, pp. 1043-51.
-
(1998)
Proc., Technical Program NEPCON West '98 Conference, Anaheim, CA
, vol.3
, pp. 1043-1051
-
-
Anderson, B.1
Ahmad, I.2
Tucker, D.3
Goldstein, S.4
Fathi, Z.5
Ramamoorthy, A.6
Mead, P.7
-
12
-
-
0003495751
-
-
J. Wiley & Sons, New York, NY
-
Ma, T. P., and Dressendorfer, P. V., 1989, Ionizing radiation in MOS devices and circuits, J. Wiley & Sons, New York, NY.
-
(1989)
Ionizing Radiation in MOS Devices and Circuits
-
-
Ma, T.P.1
Dressendorfer, P.V.2
-
13
-
-
0003705471
-
-
Van Nostrand Reinhold, New York, NY
-
Messenger, G., and Ash, M., 1992, The Effects of Radiation on Electronic Systems, 2nd Edition, Van Nostrand Reinhold, New York, NY.
-
(1992)
The Effects of Radiation on Electronic Systems, 2nd Edition
-
-
Messenger, G.1
Ash, M.2
-
14
-
-
0141838785
-
Radiation-induced effects research in emerging photonic technologies: Vertical-cavity surface-emitting lasers, GaN light-emitting diodes, and microelectromechanical devices
-
Taylor, E. W., Paxton, A, Schone, H., Comtois, J., Sanchex, A., Michalicek, M., and Inter, J., 1997, "Radiation-induced effects research in emerging photonic technologies: vertical-cavity surface-emitting lasers, GaN Light-emitting diodes, and microelectromechanical devices," Proc., SPIE - Society for Optical Engineering: Photonics for Space Environments V, Bellingham, WA, v.3124, pp. 9-21.
-
(1997)
Proc., SPIE - Society for Optical Engineering: Photonics for Space Environments V, Bellingham, WA
, vol.3124
, pp. 9-21
-
-
Taylor, E.W.1
Paxton, A.2
Schone, H.3
Comtois, J.4
Sanchex, A.5
Michalicek, M.6
Inter, J.7
-
15
-
-
85199270766
-
Effect of γ radiation on the low frequency (1/f) noise of linear IC's
-
Khobare, S. K., 1980, "Effect of γ Radiation on the Low Frequency (1/f) Noise of Linear IC's," Microelectron. Reliab., 20, pp. 529-531.
-
(1980)
Microelectron. Reliab.
, vol.20
, pp. 529-531
-
-
Khobare, S.K.1
-
16
-
-
0024668276
-
Analysis of gamma-radiation induced instability mechanisms in CMOS transistors
-
Dimitrijev, S., Golubovic, S., Zupac, D., Pejovic, M., and Stojadinovic, N., 1992 "Analysis of gamma-radiation induced instability mechanisms in CMOS transistors," Solid-State Electronics, 32(5), pp. 349-353.
-
(1992)
Solid-State Electronics
, vol.32
, Issue.5
, pp. 349-353
-
-
Dimitrijev, S.1
Golubovic, S.2
Zupac, D.3
Pejovic, M.4
Stojadinovic, N.5
-
17
-
-
0024936191
-
Instabilities in MOS transistors
-
Stojadinovic, N., and Dimitrijev, S., 1989, "Instabilities in MOS Transistors," Reliability in Electronics: Selected Proc., Seventh Symposium on Reliability in Electronics (Relectronic '88), Microelectron. Reliab., 29(3), pp. 371-380.
-
(1989)
Reliability in Electronics: Selected Proc., Seventh Symposium on Reliability in Electronics (Relectronic '88), Microelectron. Reliab.
, vol.29
, Issue.3
, pp. 371-380
-
-
Stojadinovic, N.1
Dimitrijev, S.2
-
18
-
-
0029270861
-
Analysis of gamma-irradiation induced degradation mechanisms in power VDMOS-FETs
-
Stojadinovic, N., Golubovic, S., Djoric, S., and Dimitrijev, S., 1995, "Analysis of gamma-irradiation induced degradation mechanisms in power VDMOS-FETs," Microelectron. Reliab., 35(3), pp. 587-602.
-
(1995)
Microelectron. Reliab.
, vol.35
, Issue.3
, pp. 587-602
-
-
Stojadinovic, N.1
Golubovic, S.2
Djoric, S.3
Dimitrijev, S.4
-
19
-
-
0015770573
-
Latchup in CMOS integrated circuits
-
Gregory, B., and Shafer, B. D., 1973, "Latchup in CMOS integrated circuits," IEEE Trans. Nucl. Sci., 20, p. 293.
-
(1973)
IEEE Trans. Nucl. Sci.
, vol.20
, pp. 293
-
-
Gregory, B.1
Shafer, B.D.2
-
20
-
-
0030127490
-
Influence of VLSI technology evolution on radiation induced latchup in space systems
-
Johnston, A. H., 1996, "Influence of VLSI technology Evolution on Radiation Induced Latchup in Space Systems," IEEE Trans. Nucl. Sci., 43(2), p. 505.
-
(1996)
IEEE Trans. Nucl. Sci.
, vol.43
, Issue.2
, pp. 505
-
-
Johnston, A.H.1
-
22
-
-
0003571060
-
-
John Wiley and Sons, New York, NY
-
Amerasekera, A., and Najm, F., 1997, Failure Mechanisms in Semiconductor Devices, John Wiley and Sons, New York, NY.
-
(1997)
Failure Mechanisms in Semiconductor Devices
-
-
Amerasekera, A.1
Najm, F.2
-
23
-
-
0041314894
-
UV-radiation annealing of the electron and X-irradiation damaged CMOS transistors
-
Golubovic, S., Pejovic, M., Dimitrijev, S., and Stojadinovic, N., 1992, "UV-radiation annealing of the Electron and X-irradiation damaged CMOS transistors," Phys. Status Solidi A, 129(2), pp. 569-575.
-
(1992)
Phys. Status Solidi A
, vol.129
, Issue.2
, pp. 569-575
-
-
Golubovic, S.1
Pejovic, M.2
Dimitrijev, S.3
Stojadinovic, N.4
-
24
-
-
0019151036
-
Charge build-up in MOS system under ionizing radiation
-
Srivastava, S., Srivastava, G. P., Singh, B. R., 1980, "Charge build-up in MOS system under ionizing radiation," Microelectron. Reliab., 20(4), pp. 529-531.
-
(1980)
Microelectron. Reliab.
, vol.20
, Issue.4
, pp. 529-531
-
-
Srivastava, S.1
Srivastava, G.P.2
Singh, B.R.3
-
25
-
-
0028419307
-
The effect of cosmic rays on the soft error rate of a DRAM at ground level
-
Gorman, T. J., 1994, "The Effect of Cosmic Rays on the Soft Error Rate of a DRAM at Ground Level," IEEE Trans. Electron Devices, ED-41, pp. 553-557.
-
(1994)
IEEE Trans. Electron Devices
, vol.ED-41
, pp. 553-557
-
-
Gorman, T.J.1
-
26
-
-
0141615627
-
Microwave-induced metallization damage and surface shorts in semiconductors
-
Amadori, R., and Simons, M., 1971, "Microwave-Induced Metallization Damage and Surface Shorts in Semiconductors," IEEE Trans. Reliab., 20(3), pp. 196-197.
-
(1971)
IEEE Trans. Reliab.
, vol.20
, Issue.3
, pp. 196-197
-
-
Amadori, R.1
Simons, M.2
-
27
-
-
0030388671
-
Characterization of intrinsic thin silicon dioxide breakdown under static and dynamic stress
-
Chaparala, P., and Suehle, J., 1996, "Characterization of Intrinsic Thin Silicon Dioxide Breakdown Under Static and Dynamic Stress," Proc., SPIE - Society for Optical Engineering: Microelectronics Manufacturing, Yield, Reliability, and Failure Analysis II, Austin, TX, vol. 2874, pp. 114-124.
-
(1996)
Proc., SPIE - Society for Optical Engineering: Microelectronics Manufacturing, Yield, Reliability, and Failure Analysis II, Austin, TX
, vol.2874
, pp. 114-124
-
-
Chaparala, P.1
Suehle, J.2
-
29
-
-
0141718530
-
Variable frequency microwave processing of underfill encapsulant for flip-chip applications
-
Mead, P. F., Pal, S., Ramamoorthy, A., Fathi, Z., and Ahmad, I., 2003, "Variable Frequency Microwave Processing of Underfill Encapsulant for Flip-Chip Applications," ASME J. Electron. Packag., 125(2), pp. X-X.
-
(2003)
ASME J. Electron. Packag.
, vol.125
, Issue.2
-
-
Mead, P.F.1
Pal, S.2
Ramamoorthy, A.3
Fathi, Z.4
Ahmad, I.5
-
30
-
-
0343167460
-
Investigation of variable frequency microwaves for cure of flip chip underfills
-
Ramamoorthy, A., Mead, P. F. 1999, "Investigation of variable frequency microwaves for cure of flip chip underfills," Proceedings of InterPACK '99: Pacific RIM/ASME International Intersociety Electronics Photonic Packaging Conference' Advances in Electronic Packaging 1999, Maui, Hawaii, ASME EEP-26(2), pp. 1569-1572.
-
(1999)
Proceedings of InterPACK '99: Pacific RIM/ASME International Intersociety Electronics Photonic Packaging Conference' Advances in Electronic Packaging 1999, Maui, Hawaii
, vol.ASME EEP-26
, Issue.2
, pp. 1569-1572
-
-
Ramamoorthy, A.1
Mead, P.F.2
-
31
-
-
0022564331
-
Accelerated corrosion testing pressure cooker at 130 degrees C
-
Burgess, J. F., and Yerman, A. J., 1986, "Accelerated corrosion testing pressure cooker at 130 degrees C," Proc., 36th Electronic Components Conference, Seattle, pp. 119-126.
-
(1986)
Proc., 36th Electronic Components Conference, Seattle
, pp. 119-126
-
-
Burgess, J.F.1
Yerman, A.J.2
-
32
-
-
0008158470
-
Innovative curing of high reliability advanced polymeric encapsulants
-
Fathi, Z., Tucker, D., Ahmad, I., Yaeger, E., Konarski, L., Crane, L., and Heaton, J. 1997, "Innovative curing of High Reliability Advanced Polymeric Encapsulants," Proc., Technical Program. NEPCON West '98. Conference, Anaheim, CA, vol. 3, pp. 1084-93.
-
(1997)
Proc., Technical Program. NEPCON West '98. Conference, Anaheim, CA
, vol.3
, pp. 1084-1093
-
-
Fathi, Z.1
Tucker, D.2
Ahmad, I.3
Yaeger, E.4
Konarski, L.5
Crane, L.6
Heaton, J.7
-
33
-
-
0030165108
-
Shock and vibration of solder bumped flip chip on organic coated boards
-
Lau, J., Schneider, E., and Baker, T., 1996, "Shock and Vibration of Solder bumped Flip Chip on Organic Coated Boards," ASME J. Electron. Packag., 118(2), pp. 101-104.
-
(1996)
ASME J. Electron. Packag.
, vol.118
, Issue.2
, pp. 101-104
-
-
Lau, J.1
Schneider, E.2
Baker, T.3
-
34
-
-
0003900137
-
-
International Thomson Publishing, New York, NY
-
Prasad, R., 1997, Surface Mount Technology, Principles and Practice, 2nd Edition, International Thomson Publishing, New York, NY.
-
(1997)
Surface Mount Technology, Principles and Practice, 2nd Edition
-
-
Prasad, R.1
|