The electric field at the apex of a near-field probe: Implications for nano-Raman spectroscopy

Journal of Raman Spectroscopy

Volumn 34, Issue 9, 2003, Pages 655-662

  Hallen, H D ^a   Jahncke, C L ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b ST LAWRENCE UNIVERSITY   (United States)

Author keywords

NSOM; Raman near field; SNOM

Indexed keywords

ELECTRIC FIELDS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PROBES;

APERTURED; ELECTRIC FIELD GRADIENTS; FAR-FIELD; LARGE-SIGNALS; NEAR FIELD PROBES; NEAR FIELDS; NEARFIELD SCANNING OPTICAL MICROSCOPY; RAMAN NEAR-FIELD; SELECTION RULES; SURFACE ENHANCEMENT;

RAMAN SPECTROSCOPY;

ARTICLE; ELECTRIC FIELD; FAR FIELD RAMAN SPECTROSCOPY; IMAGING; INTERMETHOD COMPARISON; NANOTECHNOLOGY; NEAR FIELD RAMAN SPECTROSCOPY; RAMAN SPECTROMETRY; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

EID: 0141706602     PISSN: 03770486     EISSN: None     Source Type: Journal    
DOI: 10.1002/jrs.1048     Document Type: Article

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