메뉴 건너뛰기




Volumn 26, Issue 1, 2004, Pages 3-13

Analog-to-digital converter testing - New proposals

Author keywords

ADC testing; Histogram test; Sine fitting

Indexed keywords

ALGORITHMS; DIGITAL INSTRUMENTS; GAUSSIAN NOISE (ELECTRONIC);

EID: 0141532055     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(03)00057-6     Document Type: Conference Paper
Times cited : (19)

References (21)
  • 1
    • 0141664387 scopus 로고
    • IEEE Std. 1057-1994, New York: The Institute of Electrical and Electronics Engineers, December
    • IEEE Std. 1057-1994 Standard for Digitizing Waveform Records. 1994 (December);The Institute of Electrical and Electronics Engineers, New York.
    • (1994) Standard for Digitizing Waveform Records
  • 2
    • 0011580165 scopus 로고    scopus 로고
    • IEEE 1241-2000, New York: The Institute of Electrical and Electronics Engineers
    • IEEE 1241-2000 Standard for Analog to Digital Converters. 2001;The Institute of Electrical and Electronics Engineers, New York.
    • (2001) Standard for Analog to Digital Converters
  • 4
    • 0033309978 scopus 로고    scopus 로고
    • Testing high speed high accuracy analog to digital converters embedded in systems on a chip
    • Max S. Testing high speed high accuracy analog to digital converters embedded in systems on a chip. Proceeding of the International Test Conference. 1999;763-771.
    • (1999) Proceeding of the International Test Conference , pp. 763-771
    • Max, S.1
  • 7
    • 0141664385 scopus 로고    scopus 로고
    • Uncertainties in the estimation of the code transition levels in the static test of ADCs
    • Bordeaux, France: IMEKO September
    • Cruz Serra A. Uncertainties in the estimation of the code transition levels in the static test of ADCs. 4th Workshop on ADC modeling and Testing. 1999 September;221-226 IMEKO, Bordeaux, France.
    • (1999) 4th Workshop on ADC Modeling and Testing , pp. 221-226
    • Cruz Serra, A.1
  • 8
    • 0001296881 scopus 로고    scopus 로고
    • A new measurement method for the static test of ADCs
    • Oxford, UK: Elsevier, June
    • Cruz Serra A. A new measurement method for the static test of ADCs. Comp. Stand. and Interf., CSI-22. 2000 June;149-156 Elsevier, Oxford, UK.
    • (2000) Comp. Stand. and Interf. , vol.CSI-22 , pp. 149-156
    • Cruz Serra, A.1
  • 9
    • 0141441373 scopus 로고    scopus 로고
    • private communication at IMEKO TC4 EUPAS Meeting in Trencianske Teplice, April
    • L. Michaeli, private communication at IMEKO TC4 EUPAS meeting in Trencianske Teplice, April, 1999.
    • (1999)
    • Michaeli, L.1
  • 13
    • 0028446234 scopus 로고
    • Histogram measurement of ADC nonlinearities
    • June
    • Blair J. Histogram measurement of ADC nonlinearities. IEEE Trans. Instrum. Meas. 43:1994 (June);373-383.
    • (1994) IEEE Trans. Instrum. Meas. , vol.43 , pp. 373-383
    • Blair, J.1
  • 14
    • 0029357526 scopus 로고
    • A critical note on histogram testing of data acquisition channels
    • Aug.
    • Schoukens J. A critical note on histogram testing of data acquisition channels. IEEE Trans. Instrum. Meas. 44:1995 (Aug.);860-863.
    • (1995) IEEE Trans. Instrum. Meas. , vol.44 , pp. 860-863
    • Schoukens, J.1
  • 15
    • 0000818435 scopus 로고    scopus 로고
    • Automated ADC characterization using the histogram test stimulated by Gaussian noise
    • April
    • Martins R., Cruz Serra A. Automated ADC characterization using the histogram test stimulated by Gaussian noise. IEEE Trans. Instrum. Meas. 48:1999 (April);471-474.
    • (1999) IEEE Trans. Instrum. Meas. , vol.48 , pp. 471-474
    • Martins, R.1    Cruz Serra, A.2
  • 16
    • 0034207728 scopus 로고    scopus 로고
    • ADC characterization by using the histogram test stimulated by Gaussian noise Theory and experimental results
    • Oxford, UK: Elsevier, June
    • Martins R., Cruz Serra A. ADC characterization by using the histogram test stimulated by Gaussian noise Theory and experimental results. Measurement. vol. 27:2000 June;291-300 Elsevier, Oxford, UK.
    • (2000) Measurement , vol.27 , pp. 291-300
    • Martins, R.1    Cruz Serra, A.2
  • 18
    • 0141664383 scopus 로고    scopus 로고
    • Dynamic characterisation of analog to digital converters
    • April, Sesimbra, Portugal
    • Martins R., Cruz Serra A. Dynamic characterisation of analog to digital converters. Confetele. 99:1999 (April);90-94. Sesimbra, Portugal.
    • (1999) Confetele , vol.99 , pp. 90-94
    • Martins, R.1    Cruz Serra, A.2
  • 19
    • 0035414883 scopus 로고    scopus 로고
    • A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
    • August
    • Arpaia P., Cruz Serra A., Daponte P., Líbano Monteiro C. A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing. IEEE Trans. Instrum. Meas. 50(4):2001 (August);941-948.
    • (2001) IEEE Trans. Instrum. Meas. , vol.50 , Issue.4 , pp. 941-948
    • Arpaia, P.1    Cruz Serra, A.2    Daponte, P.3    Líbano Monteiro, C.4
  • 20
    • 0037332944 scopus 로고    scopus 로고
    • New methods to improve convergence of sine fitting algorithms
    • Oxford, UK: Elsevier
    • Fonseca da Silva M., Cruz Serra A. New methods to improve convergence of sine fitting algorithms. Computer Standards and Interfaces. vol. 25 (1):2003;23-31 Elsevier, Oxford, UK.
    • (2003) Computer Standards and Interfaces , vol.25 , Issue.1 , pp. 23-31
    • Fonseca da Silva, M.1    Cruz Serra, A.2
  • 21
    • 0036887743 scopus 로고    scopus 로고
    • Nonlinearity Representation and PDF Measurement of ADC Testing Signals
    • Elsevier, Oxford, UK, December
    • Martins R.C., Serra A.C. Nonlinearity Representation and PDF Measurement of ADC Testing Signals. Measurement. vol. 32 (4):2002 December;281-288 Elsevier, Oxford, UK.
    • (2002) Measurement , vol.32 , Issue.4 , pp. 281-288
    • Martins, R.C.1    Serra, A.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.