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Volumn 22, Issue 2, 2000, Pages 149-156

A new measurement method for the static test of ADCs

Author keywords

ADC testing; Extrapolated convergence factor method; Static test

Indexed keywords


EID: 0001296881     PISSN: 09205489     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5489(00)00042-8     Document Type: Article
Times cited : (11)

References (8)
  • 1
    • 0032157336 scopus 로고    scopus 로고
    • International standardization of ADC-based measuring systems - State of the art
    • P. Arpaia, H. Schumny, International standardization of ADC-based measuring systems - state of the art, J. Comput. Stand. Interfaces CSI-19 (1998) 173-188.
    • (1998) J. Comput. Stand. Interfaces CSI-19 , pp. 173-188
    • Arpaia, P.1    Schumny, H.2
  • 2
    • 0028740233 scopus 로고
    • Static and dynamic testing of A/D converters using VXI based system
    • Hamamatsu, Japan
    • A. Cruz Serra, P. Silva Girão, Static and dynamic testing of A/D converters using VXI based system, IEEE IMTC'94 (1994) 903-906, (Hamamatsu, Japan).
    • (1994) IEEE IMTC'94 , pp. 903-906
    • Cruz Serra, A.1    Silva Girão, P.2
  • 4
    • 0346833512 scopus 로고    scopus 로고
    • Electronic Industries Association (EIA). http://www. eia.org.
  • 5
    • 0346833511 scopus 로고    scopus 로고
    • European Project for ADC-Based Devices Standardization (EUPAS). http://remlab.dis.unina.it.
  • 6
    • 0003443355 scopus 로고
    • The Institute of Electrical and Electronics Engineers, New York
    • IEEE Std. 1057-1994, IEEE standard for digitizing waveform records, The Institute of Electrical and Electronics Engineers, New York, 1994.
    • (1994) IEEE Standard for Digitizing Waveform Records
  • 8
    • 0346202906 scopus 로고    scopus 로고
    • International Electrotechnical Commission (IEC). http:// www.iec.ch.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.