Automated ADC characterization using the histogram test stimulated by Gaussian noise

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 2, 1999, Pages 471-474

  Martins, Raul Carneiro ^a   Manuel Da Cruz Serra, António ^a  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

Author keywords

Analog to digital conversion; Gaussian noise; Statistical testing; White noise

Indexed keywords

EID: 0000818435     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769631     Document Type: Article

References (6)

1. J. Doernberg, H. Lee, and D. Hodges, "Full speed testing of A/D converters," IEEE J. Solid-State Circuits, vol. SC-19, pp. 820-827, Dec. 1984.
2. J. Blair, "Histogram measurement of ADC nonlinearities using sine waves," IEEE Trans. Instrum. Meas., vol. 43, pp. 373-383, June 1994.
3. J. Schoukens, "A critical note on histogram testing of data acquisition channels," IEEE Trans. Instrum. Meas., vol. 44, pp. 860-863, Aug. 1995.
4. R. Martins and A. Serra, "The use of a noise stimulus in ADC characterization," in Proc. ICECS 1998, Lisbon, Portugal, pp. 457-460, Sept. 7-10, 1998.
5. A. Papoulis, Probability, Random Variables, and Stochastic Processes, 3rd ed. New York: McGraw-Hill, 1991.
6. R. Martins and A. Serra, "Automated ADC characterization using the histogram test stimulated by Gaussian noise," in CPEM98 Dig., Washington D.C., July 6-10, 1998, pp. 313-314.