ADC characterization by using the histogram test stimulated by Gaussian noise: Theory and experimental results

Measurement: Journal of the International Measurement Confederation

Volumn 27, Issue 4, 2000, Pages 291-300

  Martins, Raul Carneiro ^a   Serra, António Cruz ^a  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FITS AND TOLERANCES; NOISE GENERATORS; SPURIOUS SIGNAL NOISE; WHITE NOISE;

HISTOGRAM;

ANALOG TO DIGITAL CONVERSION;

EID: 0034207728     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(99)00075-5     Document Type: Article

References (8)

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3. IEEE . Standard 1057 for Digitizing Waveform Recorders. 1994;IEEE. December.
4. R. Martins, Dynamic characterization of analog-to-digital converters, Masters thesis (in Portuguese), January 1999.
5. Martins R., Ramos H., Girão P., Serra A. Taxonomic problems on ADC characterization. Proc. of ICECS, Lisbon, Portugal, 7-10 September :1998.
6. Wagdy M.F., Awad S.S. Determining ADC effective number of bits via histogram test. IEEE Trans. Instrum. Meas. 40:1991;770-772.
7. Martins R., Serra A. Automated ADC characterization using the histogram test stimulated by Gaussian noise. IEEE Trans. Instrum. Meas. 48:(2):1999;471-474.
8. Papoulis A. Probability, Random Variables, and Stochastic Processes. 3rd Edition :1991;McGraw-Hill, New York.