Nonlinearity representation and PDF measurement of ADC testing signals

Measurement: Journal of the International Measurement Confederation

Volumn 32, Issue 4, 2002, Pages 281-288

  Martins, Raul Carneiro ^a   Serra, António Cruz ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Histogram method; Nonlinearity measurement and representation; Probability density function distortion

Indexed keywords

FREQUENCIES; NONLINEAR SYSTEMS; PROBABILITY DENSITY FUNCTION; SIGNAL THEORY; STOCHASTIC CONTROL SYSTEMS;

NONLINEARITY MEASUREMENT;

ANALOG TO DIGITAL CONVERSION;

EID: 0036887743     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(02)00036-2     Document Type: Conference Paper

References (6)

1. Martins R., Serra A. Automated ADC characterisation using the histogram test stimulated by Gaussian noise IEEE Trans. Instrum. Meas. 48: 2 1999 471-474.
2. R. Martins, A. Serra, ADC Characterisation by using the histogram test stimulated by Gaussian noise. Theory and experimental results, Measurement 27 (4), 291-300.
3. IEEE Standard 1057-1994, IEEE Standard for Digitizing Waveform Recorders, Dec. 1994.
4. Schoukens J. A critical note on histogram testing of data acquisition channels IEEE Trans. Instrum. Meas. 44: 1995 860-863.
5. Oliver B.M., Cage J.M. Electronic measurements and instrumentation Inter-University Electronic Series Vol. 12: 1971 McGraw-Hill New York.
6. Martins R., Serra A. Nonlinearities, the generators perspective in ADC statistical testing techniques 6th Euro Workshop on ADC Modelling and Testing, Lisbon, September 2001.