ADC histogram test by triangular small-waves

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1690-1695

  Alegria, Francisco ^a   Arpaia, Pasquale ^b   Da Cruz Serra, António M ^a   Daponte, Pasquale ^c  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^c UNIVERSITY OF SANNIO   (Italy)

Author keywords

ADC testing; Histogram method; Static test

Indexed keywords

COMPUTER SIMULATION; DATA ACQUISITION; DIGITAL DEVICES; ELECTRONIC EQUIPMENT TESTING; NUMERICAL METHODS; STANDARDIZATION; WAVEFORM ANALYSIS; WAVES;

ANALOG TO DIGITAL CONVERTER HISTOGRAM; QUASI-STATIC TEST; SMALL-AMPLITUDE TRIANGULAR WAVES;

ANALOG TO DIGITAL CONVERSION;

EID: 0034830003     PISSN: 10915281     EISSN: None     Source Type: Journal    
DOI: 10.1109/IMTC.2001.929490     Document Type: Article

References (13)

1. A new measurement method for the static test of ADCs
2. An ADC histogram test based on small-amplitude waves
3. ADC histogram test using small-amplitude input waves
4. Histogram measurement of ADC nonlinearities using sine waves
5. The fast method for correction of systematic errors of ADC histogram measurements
6. Fast dynamic methods of the systematic error autocorrection
7. Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
8. Improved definition of the effective number of bits in ADC testing
9. Full-speed testing of A/D converters
10. ADC sinewave histogram testing with quasi-choerent sampling
11. About the number of records to be acquired for histogram testing of A/D converters using synchronous sinewave and clock generators