New measurement procedure for the static test of ADCs

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2000, Pages 866-871

  Cruz Serra, A ^a  

^a UNIVERSITY OF LISBON   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CONVERGENCE OF NUMERICAL METHODS; EXTRAPOLATION; INTEGRATED CIRCUIT TESTING; STANDARDS;

EXTRAPOLATED CONVERGENCE FACTOR METHOD; STATIC TESTS;

ANALOG TO DIGITAL CONVERSION;

EID: 0033725938     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

1. J. Doemberg, H. Lee and D. Hodges, "Full speed testing of A/D converters", IEEE J. Solid-state Circuits, vol. SC- 19, pp.820-827, Dec. 1984.
2. J. Blair, "Histogram measurement of ADC nonlinearities using sine waves", IEEE Trans. Instr. Meas., vol. 43, pp. 373-383, Jun. 1994.
3. M. Benkai's, S. Le Masson and P. Marchegay, "A/D converter characterization by spectral analysis in "dualtone" mode", IEEE Trans. Instr. Meas., vol. 44, pp. 940- 944, Oct. 1995.
4. P. Arpaia, F. Cennamo and P. Daponte, "Metrological characterisation of Analog-to-Digital converters - a state of the art", in Proc. of IEE ADDA, pp. 134-144, Glasgow, UK, 1999.
5. IEEE Std. 1057-1994, IEEE standard for digitizing waveform records, The Institute of Electrical and Electronics Engineers, Inc., New York, Dec. 1994.
6. A. Cruz Serra, "A New Measurement Method in the static test of ADCs", Journal of Computer Standards and Interfaces, Elsevier Science, in press, 2000.
7. IEEE Std. 1241 draft, IEEE standard for terminology and test methods for analog-to-digital converters, The Institute of Electrical and Electronics Engineers, Inc..
8. A. Cruz Serra, P. Silva GirZo, "Static and Dynamic Testing Of A/D Converters Using VXI Based System", in Proc. of IEEE IMTC 94, pp. 903-906, Hamamatsu, Japan, 1994.