메뉴 건너뛰기




Volumn 781, Issue , 2001, Pages 198-215

Nanoscale surface mechanical property measurements: Force modulation techniques applied to nanoindentation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0042905759     PISSN: 00976156     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article
Times cited : (6)

References (43)
  • 8
    • 0042252669 scopus 로고    scopus 로고
    • Thesis, (Oxford, UK)
    • Asif, S. A. S., Thesis, 1997 (Oxford, UK).
    • (1997)
    • Asif, S.A.S.1
  • 34
    • 0027870692 scopus 로고
    • Thin films: Stresses and mechanical properties IV
    • MRS: Pittsburgh, PA
    • Jarvis, S.P.; Weihs, T.P.; Oral, A.; Pethica, J. B. Thin Films: Stresses and Mechanical Properties IV, MRS Symposium Proceedings; MRS: Pittsburgh, PA, 1993, Vol. 308; pp127-132.
    • (1993) MRS Symposium Proceedings , vol.308 , pp. 127-132
    • Jarvis, S.P.1    Weihs, T.P.2    Oral, A.3    Pethica, J.B.4
  • 42
    • 0043255081 scopus 로고    scopus 로고
    • Thin films: Stresses and mechanical properties vIII
    • MRS: Pittsburgh, PA, in press
    • Asif, S. A. S.; Wahl, K. J.; Colton, R. J., Thin Films: Stresses and Mechanical Properties VIII, MRS Symposium Proceedings; MRS: Pittsburgh, PA, 2000, Vol. 594, in press.
    • (2000) MRS Symposium Proceedings , vol.594
    • Asif, S.A.S.1    Wahl, K.J.2    Colton, R.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.