Toward an absolute measurement of LIDT

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4932, Issue , 2003, Pages 224-237

  Natoli, J Y ^a   Gallais, L ^a   Bertussi, B ^a   Commandre M ^a   Amra, C ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Bulk and surface damage; Damage testing process; Laser beam characterization; Laser damage threshold; Localized study; Silica; Test procedure

Indexed keywords

PARAMETER ESTIMATION; REAL TIME SYSTEMS; SILICA; SURFACE STRUCTURE;

DAMAGE TESTING PROCESS;

LASER DAMAGE;

EID: 0042863045     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472411     Document Type: Conference Paper

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