Automated damage onset analysis techniques applied to KDP damage and the Zeus small area damage test facility

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3902, Issue , 2000, Pages 361-368

  Sharp III, Richard ^a   Runkel, Mike ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; CHEMICAL CLEANING; DIGITAL SIGNAL PROCESSING; OPTICAL MATERIALS;

AUTOMATED DAMAGE ONSET ANALYSIS;

LASER DAMAGE;

EID: 0033877801     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)