Utilisation of a micro-tip scanning Kelvin probe for non-invasive surface potential mapping of mc-Si solar cells

Solar Energy Materials and Solar Cells

Volumn 79, Issue 4, 2003, Pages 485-494

  Dirscherl, Konrad ^a   Baikie, Iain ^b   Forsyth, Gregor ^b   Van der Heide, Arvid ^c  

^a ROBERT GORDON UNIVERSITY   (United Kingdom)

^b Environmental Research Institute   (United Kingdom)

^c TNO   (Netherlands)

Author keywords

High resolution scanning Kelvin probe; Multi crystalline silicon; Non invasive surface charge profiling; Shunt detection; Surface potential mapping

Indexed keywords

GRAIN BOUNDARIES; OPTICAL RESOLVING POWER; SCANNING; SILICON;

SURFACE POTENTIAL MAPPING;

SOLAR CELLS;

EID: 0042512214     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(03)00064-3     Document Type: Article

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