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Surface Science

Volumn 433, Issue , 1999, Pages 249-253

UHV-compatible spectroscopic scanning Kelvin probe for surface analysis

(3) Baikie, I a Petermann, U a Lagel B a

a ROBERT GORDON UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ELECTRONIC DENSITY OF STATES; EVAPORATION; OXIDATION; PROBES; SEMICONDUCTING SILICON; SPECTROSCOPY; SPUTTERING; SURFACE TOPOGRAPHY;

KELVIN PROBE; SURFACE ANALYSIS; SURFACE PHOTOVOLTAGE SPECTROSCOPY; SURFACE PROCESSING; WORK FUNCTION;

SURFACES;

EID: 0033347948 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(99)00026-6 Document Type: Article

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.