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Volumn 257, Issue 1-2, 2003, Pages 60-68

Influence of twinned structure on the morphology of CdTe(1 1 1) layers grown by MOCVD on GaAs(1 0 0) substrates

Author keywords

A1. Atomic force microscopy; A1. Growth models; A1. X ray texture analysis; A3. Metalorganic chemical vapour deposition; B1. CdTe

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTALLIZATION; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SEMICONDUCTING GALLIUM ARSENIDE; X RAY ANALYSIS;

EID: 0042510573     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(03)01410-6     Document Type: Article
Times cited : (19)

References (42)
  • 4
    • 0005368191 scopus 로고
    • CdTe and CdZnTe as gamma-ray and X-ray detector materials
    • P. Capper (Ed.), INSPEC IEE, London
    • J.F. Butter, CdTe and CdZnTe as gamma-ray and X-ray detector materials, in: P. Capper (Ed.), Properties of Narrow Gap Cadmium-based Compounds, INSPEC IEE, London, 1994, pp. 587-590.
    • (1994) Properties of Narrow Gap Cadmium-based Compounds , pp. 587-590
    • Butter, J.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.