-
1
-
-
5844318919
-
-
P. Capper (Ed.), The Institution of Electrical Engineers, London, and references therein
-
S.J.C. Irvine, in: P. Capper (Ed.), Narrow Gap Cadmium-based Compounds, INSPEC, The Institution of Electrical Engineers, London, 1994, pp. 24-29 and references therein.
-
(1994)
Narrow Gap Cadmium-based Compounds, INSPEC
, pp. 24-29
-
-
Irvine, S.J.C.1
-
2
-
-
0029289310
-
-
N.V. Sochinskii, S. Bernardi, E. Diéguez, P. Franzosi, S.V. Kletskii, J. Crystal Growth 149 (1995) 35.
-
(1995)
J. Crystal Growth
, vol.149
, pp. 35
-
-
Sochinskii, N.V.1
Bernardi, S.2
Diéguez, E.3
Franzosi, P.4
Kletskii, S.V.5
-
3
-
-
0029217029
-
-
N.V. Sochinskii, E. Diéguez, S. Bernardi, J.C. Soares, P. Franzosi, Mater. Sci. Forum 182-184 (1995) 167.
-
(1995)
Mater. Sci. Forum
, vol.182-184
, pp. 167
-
-
Sochinskii, N.V.1
Diéguez, E.2
Bernardi, S.3
Soares, J.C.4
Franzosi, P.5
-
4
-
-
0030121765
-
-
N.V. Sochinskii, J.C. Soares, E. Alves, M.F. da Silva, P. Franzosi, S. Bernardi, E. Diéguez, J. Crystal Growth 161 (1996) 195.
-
(1996)
J. Crystal Growth
, vol.161
, pp. 195
-
-
Sochinskii, N.V.1
Soares, J.C.2
Alves, E.3
Da Silva, M.F.4
Franzosi, P.5
Bernardi, S.6
Diéguez, E.7
-
5
-
-
0342955916
-
-
T. Okamoto, T. Saito, S. Murakami, H. Nishino, K. Maruyama, Y. Nishijima, H. Wada, M. Nagashima, Y. Nogami, Appl. Phys. Lett. 69 (1996) 677.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 677
-
-
Okamoto, T.1
Saito, T.2
Murakami, S.3
Nishino, H.4
Maruyama, K.5
Nishijima, Y.6
Wada, H.7
Nagashima, M.8
Nogami, Y.9
-
6
-
-
0030084113
-
-
N.V. Sochinskii, E. Diéguez, E. Alves, M.F. da Silva, J.C. Soares, S. Bernardi, J. Garrido, F. Agulló-Rueda, Semicond. Sci. Technol. 11 (1996) 248.
-
(1996)
Semicond. Sci. Technol.
, vol.11
, pp. 248
-
-
Sochinskii, N.V.1
Diéguez, E.2
Alves, E.3
Da Silva, M.F.4
Soares, J.C.5
Bernardi, S.6
Garrido, J.7
Agulló-Rueda, F.8
-
7
-
-
0001184437
-
-
N.V. Sochinskii, V. Muñoz, V. Bellani, L. Viña, E. Diéguez, E. Alves, M.F. da Silva, J.C. Soares, S. Bernardi, Appl. Phys. Lett. 70 (1997) 1314.
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 1314
-
-
Sochinskii, N.V.1
Muñoz, V.2
Bellani, V.3
Viña, L.4
Diéguez, E.5
Alves, E.6
Da Silva, M.F.7
Soares, J.C.8
Bernardi, S.9
-
9
-
-
36449005209
-
-
T.J. de Lyon, D. Rajavel, S.M. Johnson, C.A. Cockrum, Appl. Phys. Lett. 66 (1995) 2119.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 2119
-
-
De Lyon, T.J.1
Rajavel, D.2
Johnson, S.M.3
Cockrum, C.A.4
-
11
-
-
0040125012
-
-
T.J. de Lyon, J.A. Roth, O.K. Wu, S.M. Johnson, C.A. Cockrum, Appl. Phys. Lett. 63 (1993) 818.
-
(1993)
Appl. Phys. Lett.
, vol.63
, pp. 818
-
-
De Lyon, T.J.1
Roth, J.A.2
Wu, O.K.3
Johnson, S.M.4
Cockrum, C.A.5
-
12
-
-
0343998451
-
-
S.-II Kim, M.-S. Kim, Y. Kim, C.S. Son, S.-M. Hwang, B.-D. Min, E.K. Kim, S.-K. Min, Appl. Phys. Lett. 69 (1996) 815.
-
(1996)
Appl. Phys. Lett.
, vol.69
, pp. 815
-
-
Kim, S.-I.1
Kim, M.-S.2
Kim, Y.3
Son, C.S.4
Hwang, S.-M.5
Min, B.-D.6
Kim, E.K.7
Min, S.-K.8
-
13
-
-
0042844451
-
-
M. Eckel, D. Ottenwälder, F. Scholz, G. Frankowsky, T. Wacker, A. Hangleiter, Appl. Phys. Lett. 64 (1994) 854.
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 854
-
-
Eckel, M.1
Ottenwälder, D.2
Scholz, F.3
Frankowsky, G.4
Wacker, T.5
Hangleiter, A.6
-
15
-
-
0027543449
-
-
M.A. Cotta, R.A. Hamm, T.W. Staley, R.D. Yadvish, L.R. Harriott, H. Temkin, Appl. Phys. Lett. 62 (1993) 496.
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 496
-
-
Cotta, M.A.1
Hamm, R.A.2
Staley, T.W.3
Yadvish, R.D.4
Harriott, L.R.5
Temkin, H.6
-
16
-
-
0028497997
-
-
N.V. Sochinskii, M.D. Serrano, V.N. Babentsov, N.I. Tarbaev, J. Garrido, E. Diéguez, Semicond. Sci. Technol. 9 (1994) 1713.
-
(1994)
Semicond. Sci. Technol.
, vol.9
, pp. 1713
-
-
Sochinskii, N.V.1
Serrano, M.D.2
Babentsov, V.N.3
Tarbaev, N.I.4
Garrido, J.5
Diéguez, E.6
-
18
-
-
0030128074
-
-
N.V. Sochinskii, J.C. Soares, E. Alves, M.F. da Silva, P. Franzosi, E. Dieguez, Semicond. Sci. Technol. 11 (1996) 542.
-
(1996)
Semicond. Sci. Technol.
, vol.11
, pp. 542
-
-
Sochinskii, N.V.1
Soares, J.C.2
Alves, E.3
Da Silva, M.F.4
Franzosi, P.5
Dieguez, E.6
-
19
-
-
0026206004
-
-
S. Bernardi, C. Bocchi, C. Ferrari, P. Franzosi, L. Lazzarini, J. Crystal Growth 113 (1991) 53.
-
(1991)
J. Crystal Growth
, vol.113
, pp. 53
-
-
Bernardi, S.1
Bocchi, C.2
Ferrari, C.3
Franzosi, P.4
Lazzarini, L.5
-
20
-
-
30244569449
-
-
P. Capper (Ed.), the Institution of Electrical Engineers, London, and references therein
-
S. Bernardi, P. Franzosi, in: P. Capper (Ed.), Narrow Gap Cadmium-based Compounds, INSPEC, the Institution of Electrical Engineers, London, 1994, pp. 196-200 and references therein.
-
(1994)
Narrow Gap Cadmium-based Compounds, INSPEC
, pp. 196-200
-
-
Bernardi, S.1
Franzosi, P.2
-
21
-
-
5544273228
-
-
J.G. Correia, A.A. Melo, M.F. da Silva, J.C. Soares, H. Haas, M.D. Serrano, E. Diéguez, Nucl. Instrum. Methods B 63 (1992) 248.
-
(1992)
Nucl. Instrum. Methods B
, vol.63
, pp. 248
-
-
Correia, J.G.1
Melo, A.A.2
Da Silva, M.F.3
Soares, J.C.4
Haas, H.5
Serrano, M.D.6
Diéguez, E.7
-
22
-
-
0029276791
-
-
N.V. Sochinskii, M.D. Serrano, E. Diéguez, F. Agulló-Rueda, U. Pal, J. Piqueras, P. Fernández, J. Appl. Phys. 77 (1995) 2806.
-
(1995)
J. Appl. Phys.
, vol.77
, pp. 2806
-
-
Sochinskii, N.V.1
Serrano, M.D.2
Diéguez, E.3
Agulló-Rueda, F.4
Pal, U.5
Piqueras, J.6
Fernández, P.7
-
23
-
-
0029322895
-
-
N.V. Sochinskii, E. Diéguez, U. Pal, J. Piqueras, P. Fernández, F. Agulló-Rueda, Semicond. Sci. Technol. 10 (1995) 870.
-
(1995)
Semicond. Sci. Technol.
, vol.10
, pp. 870
-
-
Sochinskii, N.V.1
Diéguez, E.2
Pal, U.3
Piqueras, J.4
Fernández, P.5
Agulló-Rueda, F.6
|