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Volumn 179, Issue 3-4, 1997, Pages 585-591

Selective area vapor-phase epitaxy and structural properties of Hg1-xCdxTe on sapphire

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE EFFECTS; INTERDIFFUSION (SOLIDS); METALLORGANIC VAPOR PHASE EPITAXY; PHOTOLITHOGRAPHY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING CADMIUM COMPOUNDS; SINGLE CRYSTALS; SUBSTRATES;

EID: 0031209041     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(97)00153-X     Document Type: Article
Times cited : (9)

References (23)
  • 1
    • 5844318919 scopus 로고
    • P. Capper (Ed.), The Institution of Electrical Engineers, London, and references therein
    • S.J.C. Irvine, in: P. Capper (Ed.), Narrow Gap Cadmium-based Compounds, INSPEC, The Institution of Electrical Engineers, London, 1994, pp. 24-29 and references therein.
    • (1994) Narrow Gap Cadmium-based Compounds, INSPEC , pp. 24-29
    • Irvine, S.J.C.1
  • 20
    • 30244569449 scopus 로고
    • P. Capper (Ed.), the Institution of Electrical Engineers, London, and references therein
    • S. Bernardi, P. Franzosi, in: P. Capper (Ed.), Narrow Gap Cadmium-based Compounds, INSPEC, the Institution of Electrical Engineers, London, 1994, pp. 196-200 and references therein.
    • (1994) Narrow Gap Cadmium-based Compounds, INSPEC , pp. 196-200
    • Bernardi, S.1    Franzosi, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.