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Applied Physics A: Materials Science and Processing

Volumn 71, Issue 3, 2000, Pages 277-279

CdTe epilayers for uses in optical waveguides

(4) Rams, J a Sochinskii, N V b,d,e Munoz V b Cabrera, J M c

a UNIVERSIDAD REY JUAN CARLOS (Spain)

b UNIVERSITY OF VALENCIA (Spain)

c UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

d INSTITUTE OF SEMICONDUCTOR PHYSICS (Ukraine)

e New Semiconductors (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

LASER MODES; LIGHT PROPAGATION; OPTICAL VARIABLES MEASUREMENT; OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; STRUCTURE (COMPOSITION); SUBSTRATES; THICKNESS MEASUREMENT; VAPOR PHASE EPITAXY; X RAY DIFFRACTION ANALYSIS;

CADMIUM TELLURIDE EPILAYERS; EPILAYER THICKNESS; STRUCTURAL QUALITY;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0034274086 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390000510 Document Type: Article

Times cited : (20)

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