Misfit stress relaxation mechanism in CdTe(100) and CdTe/ZnTe(100) on a GaAs(100) highly mismatched heteroepitaxial layer

Journal of Applied Physics

Volumn 80, Issue 6, 1996, Pages 3238-3243

  Nishino, H ^a   Sugiyama, I ^a   Nishijima, Y ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0041721326     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363265     Document Type: Article

References (21)

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