Total dose effects on CMOS Active Pixel Sensors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3965, Issue , 2000, Pages 157-167

  Bogaerts, J ^a   Dierickx, B ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COBALT; IONIZATION OF SOLIDS; IRRADIATION; LEAKAGE CURRENTS; RADIATION DAMAGE; RADIOISOTOPES;

ACTIVE PIXEL SENSORS (APS);

IMAGE SENSORS;

EID: 0033683405     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)