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Volumn 50, Issue 6, 2003, Pages 1532-1536

High performance BCB-bridged AlGaAs/InGaAs power HFETs

Author keywords

BCB; DCFET; Power; Reliability

Indexed keywords

ALUMINUM COMPOUNDS; BUTENES; DOPING (ADDITIVES); LEAKAGE CURRENTS; PASSIVATION; SILICON NITRIDE;

EID: 0042164587     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2003.813504     Document Type: Article
Times cited : (11)

References (11)
  • 2
    • 0033889076 scopus 로고    scopus 로고
    • Suppression of gate leakage current in n-AlGaAs/GaAs power HEMTs
    • Mar
    • A. Nagayama, S. Yamauchi, and T. Hariu, "Suppression of gate leakage current in n-AlGaAs/GaAs power HEMTs," IEEE Trans. Electron Devices, vol. 47, pp. 517-522, Mar. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 517-522
    • Nagayama, A.1    Yamauchi, S.2    Hariu, T.3
  • 5
    • 0030270274 scopus 로고    scopus 로고
    • Off-state breakdown effects on gate leakage current in power pseudomorphic AlGaAs/InGaAs HEMTs
    • Oct
    • Y. C. Chou, G. P. Li, Y. C. Chen, C. S. Wu, K. K. Yu, and T. A. Midford, "Off-state breakdown effects on gate leakage current in power pseudomorphic AlGaAs/InGaAs HEMTs," IEEE Electron Device Lett., vol. 17, pp. 479-481, Oct. 1996.
    • (1996) IEEE Electron Device Lett. , vol.17 , pp. 479-481
    • Chou, Y.C.1    Li, G.P.2    Chen, Y.C.3    Wu, C.S.4    Yu, K.K.5    Midford, T.A.6
  • 9
    • 0033281675 scopus 로고    scopus 로고
    • Large-and small-signal IMD behavior of microwave power amplifiers
    • Dec
    • N. B. de Carvalho and J. C. Pedro, "Large-and small-signal IMD behavior of microwave power amplifiers," IEEE. Trans. Microwave Theory Tech., vol. 45, pp. 2364-2374, Dec. 1999.
    • (1999) IEEE. Trans. Microwave Theory Tech. , vol.45 , pp. 2364-2374
    • De Carvalho, N.B.1    Pedro, J.C.2
  • 10
    • 0033889076 scopus 로고    scopus 로고
    • Suppression of gate leakage current in n-AlGaAs/GaAs power HEMTs
    • Mar
    • A. Nagayama, S. Yamauchi, and T. Hariu, "Suppression of gate leakage current in n-AlGaAs/GaAs power HEMTs," IEEE Trans. Electron Devices, vol. 47, pp. 517-522, Mar. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 517-522
    • Nagayama, A.1    Yamauchi, S.2    Hariu, T.3
  • 11
    • 0035471291 scopus 로고    scopus 로고
    • AlGaAs/InGaAs heterostructure doped-channel FETs exhibiting good electrical performance at high temperatures
    • Oct
    • H. C. Chiu, S. C. Yang, and Y. J. Chan, "AlGaAs/InGaAs heterostructure doped-channel FETs exhibiting good electrical performance at high temperatures," IEEE Trans. Electron Device, vol. 48, pp. 2210-2215, Oct. 2001.
    • (2001) IEEE Trans. Electron Device , vol.48 , pp. 2210-2215
    • Chiu, H.C.1    Yang, S.C.2    Chan, Y.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.