Hot carrier reliability in high-power PHEMT's

Technical Digest - GaAs IC Symposium (Gallium Arsenide Integrated Circuit)

Volumn , Issue , 1996, Pages 46-49

  Chou, Y C ^a   Li, G P ^a   Yu, K K ^a   Chu, Peter ^a   Hou, L D ^a   Wu, C S ^a   Midford, T A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEGRADATION; GATES (TRANSISTOR); HOT CARRIERS; OPTIMIZATION; POWER ELECTRONICS; RELIABILITY; SCHOTTKY BARRIER DIODES;

HOT CARRIER RELIABILITY; NITRIDE DEPOSITION PROCESSES;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0030410856     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)