-
1
-
-
0005400498
-
-
and references therein
-
R. Lebert, G. Schriever, T. Wilhein, and B. Niemann, J. Appl. Phys. 84, 3419 (1998), and references therein.
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 3419
-
-
Lebert, R.1
Schriever, G.2
Wilhein, T.3
Niemann, B.4
-
2
-
-
0034757236
-
-
and references therein
-
V. Banine and R. Moors, Proc. SPIE 4343, 203 (2001), and references therein.
-
(2001)
Proc. SPIE
, vol.4343
, pp. 203
-
-
Banine, V.1
Moors, R.2
-
4
-
-
0000413753
-
-
P. Mandelbaum, M. Finkenthal, J. L. Schwob, and M. Klapisch, Phys. Rev. A 35, 5051 (1987).
-
(1987)
Phys. Rev. A
, vol.35
, pp. 5051
-
-
Mandelbaum, P.1
Finkenthal, M.2
Schwob, J.L.3
Klapisch, M.4
-
8
-
-
0036643620
-
-
M. Segers, M. Bougeard, E. Caprin, T. Ceccotti, Lederoff, M. Schmidt, D. Normand, and O. Sublemontier, Microelectron. Eng. 61-62, 139 (2002).
-
(2002)
Microelectron. Eng.
, vol.61-62
, pp. 139
-
-
Segers, M.1
Bougeard, M.2
Caprin, E.3
Ceccotti Lederoff, T.4
Schmidt, M.5
Normand, D.6
Sublemontier, O.7
-
9
-
-
0034801892
-
-
M. Wieland, T. Wilhein, M. Faubel, Ch. Ellert, M. Schmidt, and O. Sublemontier, Appl. Phys. B: Lasers Opt. 72, 591 (2001).
-
(2001)
Appl. Phys. B: Lasers Opt.
, vol.72
, pp. 591
-
-
Wieland, M.1
Wilhein, T.2
Faubel, M.3
Ellert, Ch.4
Schmidt, M.5
Sublemontier, O.6
-
13
-
-
0000417717
-
-
T. Wilhein, S. Rehbein, D. Hambach, M. Berglund, L. Rymell, and H. M. Hertz, Rev. Sci. Instrum. 70, 1694 (1999).
-
(1999)
Rev. Sci. Instrum.
, vol.70
, pp. 1694
-
-
Wilhein, T.1
Rehbein, S.2
Hambach, D.3
Berglund, M.4
Rymell, L.5
Hertz, H.M.6
-
14
-
-
0037034163
-
-
L. Juschkin, A. Chuvatin, S. V. Zakharov, S. Ellwi, and H.-J. Kunze, J. Phys. D 35, 219 (2002).
-
(2002)
J. Phys. D
, vol.35
, pp. 219
-
-
Juschkin, L.1
Chuvatin, A.2
Zakharov, S.V.3
Ellwi, S.4
Kunze, H.-J.5
-
15
-
-
0035374329
-
-
M. Schnürer, S. Ter-Avetisyan, H. Stiel, U. Vogt, W. Radloff, M. Kalashnikov, W. Sandner, and P. V. Nickles, Eur. Phys. J. D 14, 331 (2001).
-
(2001)
Eur. Phys. J. D
, vol.14
, pp. 331
-
-
Schnürer, M.1
Ter-Avetisyan, S.2
Stiel, H.3
Vogt, U.4
Radloff, W.5
Kalashnikov, M.6
Sandner, W.7
Nickles, P.V.8
-
16
-
-
22844456308
-
-
G. Schriever, K. Bergmann, and R. Lebert, J. Vac. Sci. Technol. B 17, 2058 (1999); B. A. M. Hansson, L. Rymell, M. Berglund, and H. M. Hertz, Microelectron. Eng. 53, 667 (2000).
-
(1999)
J. Vac. Sci. Technol. B
, vol.17
, pp. 2058
-
-
Schriever, G.1
Bergmann, K.2
Lebert, R.3
-
17
-
-
0034207224
-
-
G. Schriever, K. Bergmann, and R. Lebert, J. Vac. Sci. Technol. B 17, 2058 (1999); B. A. M. Hansson, L. Rymell, M. Berglund, and H. M. Hertz, Microelectron. Eng. 53, 667 (2000).
-
(2000)
Microelectron. Eng.
, vol.53
, pp. 667
-
-
Hansson, B.A.M.1
Rymell, L.2
Berglund, M.3
Hertz, H.M.4
-
18
-
-
0042676929
-
-
E. M. Gullikson, http://www-cxro.lbl.gov/optical_constants/
-
-
-
Gullikson, E.M.1
-
19
-
-
0017483530
-
-
H. W. Schnepper, L. P. Van-Speybroeck, J. P. Devaille, A. Epstein, E. Kallne, R. Z. Bachrach, J. Dijkstra, and L. Lantward, Appl. Opt. 16, 1088 (1977).
-
(1977)
Appl. Opt.
, vol.16
, pp. 1088
-
-
Schnepper, H.W.1
Van-Speybroeck, L.P.2
Devaille, J.P.3
Epstein, A.4
Kallne, E.5
Bachrach, R.Z.6
Dijkstra, J.7
Lantward, L.8
-
22
-
-
0020832081
-
-
J. Blackburn, P. K. Carroll, J. Costello, and G. O'Sullivan, J. Opt. Soc. Am. 73, 1325 (1983).
-
(1983)
J. Opt. Soc. Am.
, vol.73
, pp. 1325
-
-
Blackburn, J.1
Carroll, P.K.2
Costello, J.3
O'Sullivan, G.4
-
24
-
-
0042175738
-
-
edited by R. H. Huddlestone and S. L. Leonard (Academic, New York), Chap. 5
-
R. W. P. McWhirter in Plasma Diagnostic Techniques, edited by R. H. Huddlestone and S. L. Leonard (Academic, New York, 1965), Chap. 5.
-
(1965)
Plasma Diagnostic Techniques
-
-
McWhirter, R.W.P.1
-
26
-
-
36149021283
-
-
R. Wilson, J. Quant. Spectrosc. Radiat. Transf. 2, 477 (1962); H. R. Griem, Phys. Rev. 131, 1170 (1963).
-
(1963)
Phys. Rev.
, vol.131
, pp. 1170
-
-
Griem, H.R.1
-
27
-
-
0000268620
-
-
W. T. Silfvast, M. C. Richardson, H. Bender, A. Hanzo, V. Yanovsky, F. Jin, and J. Thorpe, J. Vac. Sci. Technol. B 10, 3126 (1992); H.-J. Kunze, L. Juschkin, and S. Ellwi, J. X-Ray Sci. Technol. 9, 13 (2001).
-
(1992)
J. Vac. Sci. Technol. B
, vol.10
, pp. 3126
-
-
Silfvast, W.T.1
Richardson, M.C.2
Bender, H.3
Hanzo, A.4
Yanovsky, V.5
Jin, F.6
Thorpe, J.7
-
28
-
-
0034927115
-
-
W. T. Silfvast, M. C. Richardson, H. Bender, A. Hanzo, V. Yanovsky, F. Jin, and J. Thorpe, J. Vac. Sci. Technol. B 10, 3126 (1992); H.-J. Kunze, L. Juschkin, and S. Ellwi, J. X-Ray Sci. Technol. 9, 13 (2001).
-
(2001)
J. X-Ray Sci. Technol.
, vol.9
, pp. 13
-
-
Kunze, H.-J.1
Juschkin, L.2
Ellwi, S.3
-
29
-
-
0000915594
-
-
A. Bar-Shalom, J. Oreg, W. H. Goldstein, D. Shvarts, and A. Zigler, Phys. Rev. A 40, 3183 (1989).
-
(1989)
Phys. Rev. A
, vol.40
, pp. 3183
-
-
Bar-Shalom, A.1
Oreg, J.2
Goldstein, W.H.3
Shvarts, D.4
Zigler, A.5
-
33
-
-
0030282972
-
-
M. Sano et al., J. Phys. B 29, 5305 (1996).
-
(1996)
J. Phys. B
, vol.29
, pp. 5305
-
-
Sano, M.1
-
38
-
-
0020832081
-
-
J. Blackburn, P. K. Carroll, J. Costello, and G. O'Sullivan, J. Opt. Soc. Am. 73, 1325 (1983).
-
(1983)
J. Opt. Soc. Am.
, vol.73
, pp. 1325
-
-
Blackburn, J.1
Carroll, P.K.2
Costello, J.3
O'Sullivan, G.4
-
40
-
-
0001300649
-
-
M. Ya. Amusia, L. V. Chernysheva, G. F. Gribakin, and K. L. Tsemekhman, J. Phys. B 23, 393 (1990).
-
(1990)
J. Phys. B
, vol.23
, pp. 393
-
-
Amusia, M.Ya.1
Chernysheva, L.V.2
Gribakin, G.F.3
Tsemekhman, K.L.4
|