Real-Time Microscopy of Two-Dimensional Critical Fluctuations: Disordering of the Si(113)-(3 ×) Reconstruction

Physical Review Letters

Volumn 77, Issue 12, 1996, Pages 2522-2525

  Tromp, R M ^a   Theis, W ^a   Bartelt, N C ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010338796     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.2522     Document Type: Article

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