"Invited"-Picosecond imaging circuit analysis of ULSI microprocessors

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 2002, Pages 1505-1508

  Mc Manus, Moyra K ^a   Song, Peilin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER DEBUGGING; COMPUTER SIMULATION; INPUT OUTPUT PROGRAMS; MICROPROCESSOR CHIPS; TRANSISTORS; ULSI CIRCUITS;

DEVICE UNDER TEST; PICOSECOND IMAGING CIRCUIT ANALYSIS;

ELECTRIC NETWORK ANALYSIS;

EID: 0036068524     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Picosecond hot electron light emission from submicron complementary metal-oxide semiconductor circuits
2. Dynamic internal testing of CMOS circuits using hot luminescence
3. Backside optical emission diagnostics for excess Iddq
4. Diagnosis and characterization of timing-related defects by time-dependent light emission
5. The attack of the 'Holey Shmoos': A case study of advanced DFD and picosecond imaging circuit analysis (PICA)