Imaging the composition of oxide-glass surfaces by friction atomic force microscopy

Langmuir

Volumn 19, Issue 17, 2003, Pages 6570-6572

  Destouches, Nathalie ^a   Foret, Marie ^a   Courtens, Eric ^a   Ramonda, Michel ^b  

^a UNIVERSITÉ MONTPELLIER 2   (France)

^b UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; OXIDES; PH EFFECTS;

TOPOGRAPHY IMAGES;

GLASS;

EID: 0041387431     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la034497c     Document Type: Article

References (23)

1. Binnig, G.; Quate, C.F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930.
2. For a recent survey, see the Proceedings of the 11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques; University of British Columbia and National Research Council: Vancouver, Canada, 2001.
3. Frisbie, C. D.; Roznyai, L. F.; Noy, A.; Wrighton, M. S.; Lieber, C. M. Science 1984, 265, 2071.
4. McKendry, R.; Theoclitou, M.-H.; Rayment, T.; Abell, C. Nature 1998, 391, 566.
5. Wong, S. S.; Joselevich, E.; Woolley, A. T.; Cheung, C. L.; Lieber, C. M. Nature 1998, 394, 52.
6. Takano, H.; Kenseth, J. R.; Wong, S.-S.; O'Brien, J. C.; Porter, M. D. Chem. Rev. 1999, 99, 2845.
7. Lin, X.-Y.; Creuzet, P.; Arribart, H. J. Phys. Chem. 1998, 97, 7272.
8. Marti, A.; Hähner, G.; Spencer, N. D. Langmuir 1995, 11, 4632.
9. Israelachvili, J. N.; Chen, Y.-L.; Yoshizawa, H. J. Adhes. Sci. Technol. 1994, 8 (11), 1231.
10. Hähner, G.; Marti, A.; Spencer, N. D. Tribol. Lett. 1997, 3, 359.
11. Schlutz, P. C. In Recent advances in fiber optics; Mitra, S. S., Bendow, B., Eds.; Plenum Press: New York, 1979.
12. FK 11 fiber optic cleaver from GN Nettest (U.K.), Ltd. http://www.nettest.com/
13. Nanoprobe, SPM tips, Digital Instruments.
14. Bogdanovic, G.; Meurk, A.; Rutland, M. W. Colloids Surf., B 2000, 19, 397.
15. Meyer, G.; Amer, N. M. Appl. Phys. Lett. 1990, 57, 2089.
16. Rädlein, E.; Frischat, G. H. J. Non-Cryst. Solids 1997, 222, 69.
17. Hammond, C. R.; Norman, S. R. Opt. Quantum Electron. 1977, 9, 399.
18. Feldman, K.; Fritz, M.; Hähner, G.; Marti, A.; Spencer, N. D. Tribal. Int. 1998, 31, 99.
19. Parks, G. A. Chem. Rev. 1965, 65, 177.
20. Diebold, C.; Lindley, P.; Viteralli, J.; Kingsley, J.; Liu, B. Y. H.; Woo, K. J. Vac. Sci. Technol., A 1998, 16, 1825.
21. Schenkel, T.; Hamza, A. V.; Barnes, A. V.; Schneider, D. H. Prog. Surf. Sci. 1999, 61, 23.
22. Schenkel, T.; Holder, J. P.; McDonald, J. W.; Meijer, J.; Persaud, A.; Schneider, D. H. Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing; Knystautas, E. J., Kirk, W. P., Browning, V., Eds. ; Proceedings of SPIE, Vol. 4468; SPIE: Bellingham, WA, 2001; pp 35-46.
23. Israelachvili, J. N. Intermolecular and surface forces, 2nd ed.; Academic Press: London, 1991; Chapter 12.