Surface forces, surface chemistry and tribology

Tribology International

Volumn 31, Issue 1-3, 1998, Pages 99-105

  Feldman, Kirill ^a   Fritz, Michaela ^a   Hähner, Georg ^a   Marti, Andreas ^a   Spencer, Nicholas D ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

AFM; Chemical imaging; Electrolytes; LFM; Nanotribology; PH; Polymers; Van der Waals

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELECTROLYTES; FRICTION; LUBRICATION; PH EFFECTS; POLYMER BLENDS; SOLUTIONS; SURFACE CHEMISTRY; VAN DER WAALS FORCES; INTERFACES (MATERIALS); SURFACE PROPERTIES;

SURFACE FORCES; LATERAL FORCE MICROSCOPE (LFM); NANOTRIBOLOGY;

TRIBOLOGY;

EID: 0031594097     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0301-679X(98)00012-7     Document Type: Conference Paper

References (15)

1. Atomic force microscope
2. Atomic scale friction of a tungsten tip on a graphite surface
3. Tunneling through a controllable vacuum gap
4. Simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope
5. Combined scanning force and friction microscopy of mica
6. Fundamental mechanisms of interfacial friction: 1. Relation between adhesion and friction
7. Relationship between adhesion and friction forces
8. Surface energy and the contact of elastic solids
9. Sensitivity of frictional forces to pH on a nanometer scale: A lateral force microscopy study
10. Tip-surface interactions
11. Reibung und pH-WERT: Eine rasterkraftmikroskopische studie
12. The influence of pH on friction between oxide surfaces in electrolytes, studied with lateral force microscopy: Application as a nanochemical imaging technique
13. Toward a force spectroscopy of polymer surfaces
14. Tribological investigations using friction force microscopy
15. Measuring electrostatic, van der Waals, and hydration forces in electrolyte solutions with an atomic force microscope