Atomic force microscopy for local characterization of surface acid-base properties

Journal of Physical Chemistry

Volumn 97, Issue 28, 1993, Pages 7272-7276

  Lin, Xue Yun ^a   Creuzet, François ^a   Arribart, Hervé ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039352169     PISSN: 00223654     EISSN: None     Source Type: Journal    
DOI: 10.1021/j100130a025     Document Type: Article

References (27)