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Volumn 24, Issue 7, 2003, Pages 433-435

Wideband DHBTs using a graded carbon-doped InGaAs base

Author keywords

Carbon doping; Heterojunction bipolar transistor; Palladium

Indexed keywords

CARBON; ELECTRIC CONDUCTIVITY; OHMIC CONTACTS; PALLADIUM; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR DOPING; SEMICONDUCTOR SUPERLATTICES;

EID: 0041385870     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2003.815009     Document Type: Letter
Times cited : (38)

References (12)
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  • 5
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    • The importance of bandgap narrowing distribution between the conduction and valence bands in abrupt HBTs
    • July
    • J. M. Lopez-Gonzalez and L. Prat, "The importance of bandgap narrowing distribution between the conduction and valence bands in abrupt HBTs," IEEE Trans. Electron Devices, vol. 44, pp. 1046-1051, July 1997.
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    • Lopez-Gonzalez, J.M.1    Prat, L.2
  • 6
    • 0029273559 scopus 로고
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    • Mar.
    • Y. Betser and D. Ritter, "High emitter efficiency in InP/GaInAs HBT's with ultra high base doping levels," IEEE Electron Device Lett., vol. 16, pp. 97-99, Mar. 1995.
    • (1995) IEEE Electron Device Lett. , vol.16 , pp. 97-99
    • Betser, Y.1    Ritter, D.2
  • 7
    • 0011962988 scopus 로고    scopus 로고
    • Simulation of heterojunction bipolar transistors
    • Ph.D. dissertation. Tech. Univ. Wien, Austria
    • V. Pavlanovski, (2000) "Simulation of heterojunction bipolar transistors",. Ph.D. dissertation. Tech. Univ. Wien, Austria. s/palankovski/
    • (2000)
    • Pavlanovski, V.1
  • 9
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    • Delay of Kirk effect due to collector current spreading in heterojunction bipolar transistors
    • Oct.
    • P. J. Zampardi and D.-S. Pan, "Delay of Kirk effect due to collector current spreading in heterojunction bipolar transistors," IEEE Electron Device Lett., vol. 17, pp. 470-472, Oct. 1996.
    • (1996) IEEE Electron Device Lett. , vol.17 , pp. 470-472
    • Zampardi, P.J.1    Pan, D.-S.2
  • 10
    • 0001521794 scopus 로고    scopus 로고
    • Electrical characterization, metallurgical investigation, and thermal stability studies of (Pd, Ti, Au)-based ohmic contacts
    • E. F. Chor, D. Zhang, H. Gong, W. K. Chong, and S. Y. Ong, "Electrical characterization, metallurgical investigation, and thermal stability studies of (Pd, Ti, Au)-based ohmic contacts," J. Appl. Phys., vol. 87, no. 5, pp. 2437-2444, 2000.
    • (2000) J. Appl. Phys. , vol.87 , Issue.5 , pp. 2437-2444
    • Chor, E.F.1    Zhang, D.2    Gong, H.3    Chong, W.K.4    Ong, S.Y.5
  • 11
    • 0030085103 scopus 로고    scopus 로고
    • Metallurgical stability of ohmic contacts on thin base InP/InGaAs/InP HBTs
    • Feb.
    • E. F. Chor, R. J. Malik, R. A. Hamm, and R. Ryan, "Metallurgical stability of ohmic contacts on thin base InP/InGaAs/InP HBTs," IEEE Electron Device Lett., vol. 17, pp. 62-64, Feb. 1996.
    • (1996) IEEE Electron Device Lett. , vol.17 , pp. 62-64
    • Chor, E.F.1    Malik, R.J.2    Hamm, R.A.3    Ryan, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.