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Volumn 44, Issue 7, 1997, Pages 1046-1051

The importance of bandgap narrowing distribution between the conduction and valence bands in abrupt HBT's

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRON TUNNELING; NUMERICAL ANALYSIS; SEMICONDUCTOR DOPING;

EID: 0031176095     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.595930     Document Type: Article
Times cited : (33)

References (30)
  • 16
    • 0025441611 scopus 로고    scopus 로고
    • R. K. Ahrenkiel, and B. M. Keyes, "Device-related material properties of heavily-doped Gallium Arsenide," Solid-State Electron. , vol. 33, no. 6, pp. 693-704, 1990.
    • M. S. Lundstrom, M. E. Klausmeier-Brown, M. R. Melloch, R. K. Ahrenkiel, and B. M. Keyes, "Device-related material properties of heavily-doped Gallium Arsenide," Solid-State Electron. , vol. 33, no. 6, pp. 693-704, 1990.
    • M. E. Klausmeier-Brown, M. R. Melloch
    • Lundstrom, M.S.1
  • 17
    • 33746967171 scopus 로고    scopus 로고
    • bandgap narrowing (BGN) in heavily-doped Si, Ge, GaAs, and GeSii- strained layers," Solid-State Electron, vol. 34, no. 5, pp. 453165, 1991.
    • S. C. Jain and D. J. Roulston, "A simple expression for bandgap narrowing (BGN) in heavily-doped Si, Ge, GaAs, and GeSii- strained layers," Solid-State Electron, vol. 34, no. 5, pp. 453165, 1991.
    • And D. J. Roulston, "A Simple Expression for
    • Jain, S.C.1
  • 23
    • 0020296889 scopus 로고    scopus 로고
    • "Material parameters of Ini- GaAsyPi-y and related binaries," J. Appl. Phys. , vol. 53, pp. 8775-8792, Dec. 1982.
    • S. Adachi, "Material parameters of Ini- GaAsyPi-y and related binaries," J. Appl. Phys. , vol. 53, pp. 8775-8792, Dec. 1982.
    • S. Adachi
  • 24
    • 0020087475 scopus 로고    scopus 로고
    • hole mobilities in silicon as a function of concentration and temperature," IEEE Trans. Electron. Devices, vol. ED-29, pp. 292-295, Feb. 1982
    • N. D. Arora, J. R. Hauser, and D. J. Roulston, "Electron and hole mobilities in silicon as a function of concentration and temperature," IEEE Trans. Electron. Devices, vol. ED-29, pp. 292-295, Feb. 1982
    • J. R. Hauser, and D. J. Roulston, "Electron and
    • Arora, N.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.