Measuring the tip-sample separation in dynamic force microscopy

Probe Microscopy

Volumn 1, Issue 4, 1999, Pages 345-354

  Bugacov, A ^a   Resch, R ^a   Baur, C ^a   Montoya, N ^a   Woronowicz, K ^a   Papson, A ^a   Koel, B E ^a   Requicha, A ^a   Will, P ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

Nanomanipulation; Nanoparticles; Nanostructures; Nanotechnology; Scanning probe microscopy (SPM)

Indexed keywords

GOLD; NANOPARTICLE; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; BIOTECHNOLOGY; CHEMICAL STRUCTURE; MEASUREMENT; SAMPLE; SENSOR;

EID: 0032850291     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)