Ohmic contact formation mechanism of Ni on n-type 4H-SiC

Applied Physics Letters

Volumn 79, Issue 12, 2001, Pages 1816-1818

  Man, Sang Youn ^a   Kim, Ki Hong ^a   Kim, Jong Kyu ^a   Jang, Ho Won ^a   Lee, Kwang Ho ^a   Kim, Nam Kyun ^a,b   Kim, Eun Dong ^a,b   Lee, Jong Lam ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039149501     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1404998     Document Type: Article

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