Lateral epitaxial overgrowth of InAs on (100) GaAs substrates

Materials Research Society Symposium - Proceedings

Volumn 744, Issue , 2002, Pages 9-14

  Suryanarayanan, Ganesan ^a   Khandekar, Anish A ^a   Hawkins, Brian E ^a   Kuech, Thomas F ^a   Babcock, Susan E ^a,b  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SILICA; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CROSS SECTIONAL TRANSMISSION ELECTRON MICROSCOPY; DOUBLE CRYSTAL X-RAY DIFFRACTION; LATERAL EPITAXIAL OVERGROWTH; X-RAY ROCKING CURVE;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0038826670     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-744-m1.4     Document Type: Conference Paper

References (7)

1. S.-M. Kim et al, J. Korean Phys. Soc. 40 (1), 119 (2002).
2. G. Wagner, Cryst. Res. Tech. 33 (5), 681 (1998), and references therein.
3. S.S. Yi, D.M. Hansen, C.K. Inoki, D.L. Harris, T.S. Kuan, and T.F. Kuech, Appl. Phys. Lett. 77 (6), 842 (2000).
4. T.S. Zheleva, O.-H. Nam, M.D. Bremser, and R.F. Davis, Appl. Phys. Lett. 71, 2472 (1997).
5. H. Marchand, J.P. Ibbetson, P. Fini, P. Kozodoy, S. Keller, J.S. Speck, S.P. DenBaars, U.K. Mishra, J. Cryst. Growth 209, 581 (2000), and references therein.
6. K.A. Dunn, S.E. Babcock, D.S. Stone, R.J. Matyi, L. Zhang, and T.F. Kuech, MRS Int. J. Nitride Semicond. Res. 5S1, W2.11 (2000).
7. A.A. Khandekar, G. Suryanarayanan, S.E. Babcock and T.F. Kuech (as yet unpublished).