Calibration of AFM cantilever spring constants

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 113-118

  Gibson, Christopher T ^a   Weeks, Brandon L ^a   Abell, Chris ^a   Rayment, Trevor ^a   Myhra, Sverre ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b GRIFFITH UNIVERSITY   (Australia)

Author keywords

Cantilever; Q factor; Resonant frequency and spring constant

Indexed keywords

ELASTIC MODULI; GOLD; NATURAL FREQUENCIES; SPRINGS (COMPONENTS); THICKNESS MEASUREMENT; THIN FILMS;

CANTILEVERS;

ATOMIC FORCE MICROSCOPY;

GOLD;

ACCURACY; ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; CHEMICAL ANALYSIS; CHEMICAL PARAMETERS; DENSITY; FILM; MATHEMATICAL ANALYSIS; PHYSICAL CHEMISTRY; RELIABILITY; THICKNESS; YOUNG MODULUS;

EID: 0038542816     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00035-4     Document Type: Article

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