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Volumn 173, Issue 2-3, 2003, Pages 265-270

Depth profiling characterisation of the surface layer obtained by pulsed Nd:YAG laser irradiation of titanium in nitrogen

Author keywords

Depth profiling; Laser nitriding; Titanium; Titanium nitride

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; LASER PULSES; NEODYMIUM LASERS; PRESSURE EFFECTS; STOICHIOMETRY; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0038269846     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00520-6     Document Type: Article
Times cited : (177)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.