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Volumn 355, Issue , 1999, Pages 374-379
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XPS analyses of TiN films on Cu substrates after annealing in the controlled atmosphere
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
ANNEALING;
COPPER;
DEPOSITION;
FILM PREPARATION;
GAS ADSORPTION;
NITROGEN;
OXIDATION;
PROTECTIVE COATINGS;
SUBSTRATES;
TITANIUM NITRIDE;
X RAY PHOTOELECTRON SPECTROSCOPY;
CATHODIC ARC PLASMA DEPOSITION METHODS;
THIN FILMS;
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EID: 0033364586
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(99)00454-X Document Type: Article |
Times cited : (96)
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References (15)
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