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Volumn 355, Issue , 1999, Pages 374-379

XPS analyses of TiN films on Cu substrates after annealing in the controlled atmosphere

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; COPPER; DEPOSITION; FILM PREPARATION; GAS ADSORPTION; NITROGEN; OXIDATION; PROTECTIVE COATINGS; SUBSTRATES; TITANIUM NITRIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033364586     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00454-X     Document Type: Article
Times cited : (96)

References (15)
  • 8
    • 0003942258 scopus 로고
    • D. Briggs, Seah M.P. Chichester: Wiley
    • Sherwood P.M.A. Briggs D., Seah M.P. Practical Surface Science. 2nd ed. 1990;582 Wiley, Chichester.
    • (1990) Practical Surface Science , vol.2 , pp. 582
    • Sherwood, P.M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.