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Volumn 212-213, Issue SPEC., 2003, Pages 912-919
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Comparison of classical and BEN nucleation studied on thinned Si (1 1 1) samples: A HRTEM study
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Author keywords
Bias enhanced nucleation; Diamond; HFCVD; HRTEM; Nucleation mechanisms
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
DIAMONDS;
DIFFRACTION;
NUCLEATION;
TRANSMISSION ELECTRON MICROSCOPY;
BIAS ENHANCED NUCLEATION (BEN);
SILICON;
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EID: 0038209550
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(03)00086-2 Document Type: Conference Paper |
Times cited : (11)
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References (18)
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