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Volumn 9, Issue 9, 2000, Pages 1696-1702

Electron microscopy of interfaces in chemical vapour deposition diamond films on silicon

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; CRYSTAL LATTICES; CRYSTAL ORIENTATION; ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); NANOSTRUCTURED MATERIALS; NUCLEATION; SILICON; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034275721     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(00)00300-9     Document Type: Article
Times cited : (27)

References (14)
  • 8
    • 85120134887 scopus 로고    scopus 로고
    • D. Wittorf Diss. D 82 RWTH Aachen, Research Centre Jülich Report, JÜL-3637 1999 Jülich Research Centre Aachen
    • (1999)
    • Wittorf, D.1
  • 13
    • 85120121856 scopus 로고    scopus 로고
    • H. Kawarada B. Dischler C. Wild Low Pressure Synthetic Diamond 1998 Springer Berlin 139
    • (1998) , pp. 139
    • Kawarada, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.