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Volumn 4980, Issue , 2003, Pages 130-137

Surface characterization and adhesion analysis for polysilicon surface micromachined flaps

Author keywords

Adhesion; Polycrystalline silicon; Sacrificial micromachining; Surface roughness; Tip wear test

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; MICROELECTROMECHANICAL DEVICES; POLYSILICON; STICTION; SURFACE PROPERTIES; SURFACE ROUGHNESS; TRIBOLOGY; WEAR OF MATERIALS;

EID: 0038058948     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472729     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 1
    • 0032138470 scopus 로고    scopus 로고
    • Surface micromachining for microelectromechanical systems
    • J.M. Bustillo, R.T. Howe, and R.S. Muller, "Surface Micromachining for Microelectromechanical Systems," Proceedings of the IEEE, 86, pp. 1552-1574, 1998.
    • (1998) Proceedings of the IEEE , vol.86 , pp. 1552-1574
    • Bustillo, J.M.1    Howe, R.T.2    Muller, R.S.3
  • 2
    • 0031707293 scopus 로고    scopus 로고
    • Surface process in MEMS technology
    • R. Maboudian, "Surface Process in MEMS Technology," Surface Science Reports, 30, pp. 207-269, 1998.
    • (1998) Surface Science Reports , vol.30 , pp. 207-269
    • Maboudian, R.1
  • 4
    • 0030435042 scopus 로고    scopus 로고
    • Surface engineering and microtribology for microelectromechanical systems
    • K. Komvopoulos, "Surface Engineering and Microtribology for Microelectromechanical Systems," Wear, 200, pp. 305-327, 1996
    • (1996) Wear , vol.200 , pp. 305-327
    • Komvopoulos, K.1
  • 6
    • 0035442319 scopus 로고    scopus 로고
    • Carbon nanotube tip probes: Stability and lateral resolution in scanning probe microscopy and application to surface science in semiconductors
    • C. V. Nguyen, K. Chao, R. M. D. Stevens, L. Delzeit, A. Cassell, J. Han, and M. Meyyappan, "Carbon Nanotube Tip Probes: Stability and Lateral Resolution in Scanning Probe Microscopy and Application to Surface Science in Semiconductors," Nanotechnology, 12, pp. 363-367, 2001.
    • (2001) Nanotechnology , vol.12 , pp. 363-367
    • Nguyen, C.V.1    Chao, K.2    Stevens, R.M.D.3    Delzeit, L.4    Cassell, A.5    Han, J.6    Meyyappan, M.7
  • 9
    • 0003788740 scopus 로고    scopus 로고
    • Imperial College Press, London
    • T. R. Thomas, Rough Surface, Imperial College Press, London, 1998.
    • (1998) Rough Surface
    • Thomas, T.R.1
  • 11
    • 3943070464 scopus 로고    scopus 로고
    • Critical review: Adhesion in surface micromachined structures
    • R. Maboudian, and R.T. Howe, "Critical Review: Adhesion in Surface Micromachined Structures," Journal of Vacuum Science Technology B, 15, pp. 1-20, 1997.
    • (1997) Journal of Vacuum Science Technology B , vol.15 , pp. 1-20
    • Maboudian, R.1    Howe, R.T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.